Nikon Metrology. Inspection systems that provide complete information about complex industrial parts by looking “inside” their structures using X-rays and computerized tomography (CT) scans.
Nikon Metrology
Inspection systems that provide complete information on complex industrial parts by looking “inside” their structures using X-rays and computed tomography (CT) :
· X-ray and CT based inspection systems
· Measuring instruments
· CNC measuring systems
· White Light Interferometric Microscopes
· 3D Metrology
· Large Volume Inspection
· X-ray and CT examinations
· Microscopes
· Semiconductor Inspection Equipment
· Laser Scanning
· Scanning CMM L100, LC15Dx, XC65Dx-LS, LC60Dx
· Manual scanning ModelMaker MMDx, K-Scan MMDx, ModelMaker H120
· Point cloud Focus Scan, Focus Handheld, Focus Inspection software
Coordinate Measuring Machines (CMMs) and Manipulators
ALTERA CMM Series Bridge CMMs, ALTERA SL High-speed scanning bridge CMM, ALTO Aluminum Bridge CMM, Rail-mounted bridge CMM.
Gantry CMM LK V-GP High accuracy gantry CMMs
CMM with horizontal measuring arms LK H Premium horizontal arm CMM
Shop floor coordinate measuring machines CMM In-line CMM automation
Non-contact gear inspection
HN-C3030 - High-speed, high-precision, non-contact 3D metrology
Portable CMM coordinate measuring machines
MCAx Manual Measuring Arms (measuring area up to 2-4m depending on model), MCAx20+, MCAx25+, MCAx30+, MCAx35+, MCAx40+, MCAx45+, MCAx20, MCAx25, MCAx30, MCAx35, MCAx40, MCAx45+, MCAx20, MCAx25, MCAx30, MCAx35, MCAx40, MCAx45
Optical K-CMM
Manual scanning ModelMaker MMDx, K-Scan MMDx, ModelMaker H120
X-ray and CT exams
XT H 225, XT H 225 ST, XT H 320, XT H 450, In-process CT scanners
CT Metrology MCT225
M1 configurable X-ray CT systems, M2 high-precision X-ray CT inspection system, C2 extra large-envelope X-ray
Electronic Inspection XT V 130C, XT V 160
Large Scale Metrology
Laser Radar MV331/351 - Automated, non-contact large scale metrology
Video measurement systems
iNEXIV VMA-2520, iNEXIV VMA-6555, iNEXIV VMA-4540
The nikon metrology vision iNEXIV VMA high-speed, high-precision benchtop video cameras are designed to meet the production requirements for automatic measurement of mechanical parts, electronic devices, and more.
NEXIV VMR-H303030, NEXIV VMZ-R3020, NEXIV VMZ-R4540, NEXIV VMZ-R6555, NEXIV VMZ-K3040, NEXIV VMZ-K6555.
Ultra-high precision. Nikon's high quality automatic vision system. Ideal when exceptional accuracy is important, such as for calibrating standards and sensors, master stamps and molds, and for hard-to-measure or ultra-small precision parts.
Optical measuring systems
Measuring microscopes MM-200, MM400/800
Optical comparators V-12B, V-20B
Autocollimators 6D autocollimator, 6B autocollimator
Digital height sensors MF-501, MF-1001
Industrial microscopes
AZ100 Multizoom Vertical Microscopes, Eclipse LV100ND, Eclipse LV100NDA, Eclipse LV150N, Eclipse LV150NA, Eclipse LV150NL, Eclipse L200N Series, Eclipse L300N Series, Eclipse LV100N POL, Eclipse Ci-POL, Eclipse E200POL, Eclipse LV-DAF, NWL200.
Eclipse MA100N, Eclipse MA200 inverted microscopes
Stereo microscopes SMZ25/18, SMZ1270, SMZ1270i, SMZ745/745T, SMZ445/460, SMZ800N
Measuring Microscopes MM-200, MM400/800
Semiconductor inspection
Semiconductor Equipment NWL200, NEXIV VMR-C4540
Eclipse LV100ND, Eclipse LV100NDA, Eclipse LV150N, Eclipse LV150N, Eclipse LV150NA, Eclipse LV150NL, Eclipse L200N Series, Eclipse L300N Series Semiconductor Microscopes
